Data di Pubblicazione:
2012
Abstract:
Planar multilayer ZrO2:CeO2 slab waveguides were prepared by a sol-gel route and dip-coating technique onto commercial glass substrates. The coatings were microstructurally characterized by transmission electron microscopy (TEM), X-ray diffraction (XRD) and by optical confocal microscopy. Coating thicknesses of ca. 500 nm and refractive index values of 2.069 ± 0.001 and 2.087 ± 0.001, respectively for TE and TM light polarization modes, were calculated by Dark m-line spectroscopy. This is consistent with the birefringent character of the coating, associated to the presence of anisotropic crystalline phases within the coating's vitreous matrix. Finally, propagation losses of 0.9 ± 0.2 and 1.5 ± 0.2 dB/cm were determined by the scattered light measurement for TE and TM polarization modes, respectively.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Berneschi, Simone; Righini, Giancarlo; Pelli, Stefano; NUNZI CONTI, Gualtiero
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