An EBIC method for the quantitative determination of dopant concentration at striations in LEC GaAs
Conference Paper
Publication Date:
1987
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
EBIC; GaAs; dopant concentration; striations
List of contributors:
Frigeri, Cesare
Book title:
Microscopy of Semiconducting Materials 1987
Published in: