Publication Date:
2004
abstract:
In this paper we review some synchrotron-radiation-based techniques that can take a great advantage from the
exploitation of low-temperature detectors because of their energy resolution that can be pushed down to the eV range. X-ray Absorption Spectroscopy and X-ray Fluorescence analysis appear to be at the moment the best candidates. Other techniques like High-Resolution X-ray Emission, Resonant Inelastic X-ray Scattering and Raman scattering still demand technical improvement to these promising devices
Iris type:
01.01 Articolo in rivista
List of contributors: