Data di Pubblicazione:
2004
Abstract:
In this paper we review some synchrotron-radiation-based techniques that can take a great advantage from the
exploitation of low-temperature detectors because of their energy resolution that can be pushed down to the eV range. X-ray Absorption Spectroscopy and X-ray Fluorescence analysis appear to be at the moment the best candidates. Other techniques like High-Resolution X-ray Emission, Resonant Inelastic X-ray Scattering and Raman scattering still demand technical improvement to these promising devices
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
D'Acapito, Francesco; Maurizio, Chiara
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