Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity
Academic Article
Publication Date:
1987
abstract:
We present a determination of surface dielectric functions (SDF) of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained using polarized surface differential reflectivity (SDR) technique.
Iris type:
01.01 Articolo in rivista
List of contributors:
Cricenti, Antonio; Selci, Stefano
Published in: