Dielectric functions of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained by polarized surface differential reflectivity

Articolo
Data di Pubblicazione:
1987
Abstract:
We present a determination of surface dielectric functions (SDF) of Si(111)2×1, Ge(111)2×1, GaAs(110) and GaP(110) surfaces obtained using polarized surface differential reflectivity (SDR) technique.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/209102
Pubblicato in:
SURFACE SCIENCE
Journal