TEM and photoluminescence characterization of ordered domains in Ga0.51In0.49P alloys
Contributo in Atti di convegno
Data di Pubblicazione:
1995
Abstract:
Transmission electron microscopy (TEM), photoluminescence (PL) and polarized photoluminescence excitation (PLE) spectroscopy, have been performed on MOCVD grown GaInP2 layers differently misoriented on (001) GaAs. The layers spontaneously order in CuPtB variants. The more misosoriented samples' show a higher structural order and a sharper distribution of the ordering degree in the CuPt domains. The more relevant parameters suggesting a direct relation between CuPt structure and electronic energy gap are the crystal held split-off energy of the valence band and the band-to-band transition onset in the PLE spectra.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
Transmission electron microscopy (TEM); photoluminescence (PL); polarized photoluminescence excitation (PLE) spectroscopy
Elenco autori:
Lazzarini, Laura; Nasi, Lucia; Salviati, Giancarlo
Link alla scheda completa:
Titolo del libro:
MICROSCOPY OF SEMICONDUCTING MATERIALS 1995
Pubblicato in: