Variable angle spectroscopic ellipsometry characterization of spin-coated MoS2 films

Amongst emerging Transition Metal Dichalcogenides (TMDCs), molybdenum disulfide (MoS) has attracted a remarkable interest thanks to many possible applications. In particular, MoS has potentialities not yet fully realized in solution-based applications. However, the lack of knowledge of the optical properties of MoS has significantly limited its use in many exciting photonic fields. Films prepared by solution-based exfoliation methods have never been studied to our best knowledge. The optical properties of MoS films prepared by solution-based exfoliation methods have never been studied to our best knowledge. Herein, the broadband optical properties of ~20 nm-thick MoS films deposited by spin-coating onto Si/SiO substrates were studied by means of micro-Raman spectroscopy and Variable Angle Spectroscopic Ellipsometry (VASE).