Data di Pubblicazione:
2006
Abstract:
In the present work HCl-isopropanol treated and vacuum annealed InP(001) surfaces were studied by means of low-energy electron diffraction (LEED), soft X-ray photoemission (SXPS), and reflectance anisotropy (RAS) spectroscopies. The treatment removes the natural oxide and leaves on the surface a physisorbed overlayer containing InClx and phosphorus. Annealing at 230 C induces desorption of InClx overlayer and reveals a P-rich (2 x 1) surface. Subsequent annealing at higher temperature induces In-rich (2 x 4) surface. The structural properties of chemically prepared InP(001) surfaces were found to be similar to those obtained by decapping of As/P-capped epitaxial layers. (c) 2006 Elsevier B.V. All rights reserved.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
ATOMIC-STRUCTURE; GAAS(100) SURFACES; INP(100) SURFACES; INP SURFACES; P-RICH
Elenco autori:
Placidi, Ernesto
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