Data di Pubblicazione:
2014
Abstract:
Atomic Force Microscopy (AFM) is nowadays a widely distributed imaging technique, able to achieve nanometric resolution on a broad range of samples, from innovative materials to living biological systems. The physical principle underlying the AFM technology is based on the measurement of the interaction force between a sharp tip and the sample, with picoNewton sensitivity. This aspect of AFM was more recently exploited to perform force spectroscopy experiments on single molecules, paving the way for the study of mechanical properties of single proteins and peptides.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
single molecule; force spectroscopy; Atomic Force Microscopy
Elenco autori:
Raccosta, Samuele; Landini, Ettore; Martorana, Vincenzo; SAN BIAGIO, PIER LUIGI; Vassalli, Massimo; Zora, Marcomaria; D'Anca, Fabio; Mazzola, Salvatore
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