Data di Pubblicazione:
1998
Abstract:
The selection of optimal conditions for preparing TIC coatings on oriented silicon, based on PLAD technique, was carried out by applying surface analysis (SEM, EDS, XPS, image analysis) on a series of films realised under different processing conditions. Consideration were made on the film characteristics as a function of laser fluence and informations, about the physico-chemical aspects of the ablation phenomena, were obtained. (C) 1998 Elsevier Science B.V. All rights reserved.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
TiC coatings; Surface analysis; Ablation
Elenco autori:
Santagata, Antonio
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