CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy
Articolo
Data di Pubblicazione:
2005
Abstract:
The Cd(C5F6HO2)2 polyether adducts were used in MOCVD experiments of cadmium oxide, on optical transparent SiO2 substrates. Very mild heating (44-74 8C) resulted in, thermal stable, liquid compounds that can be easily evaporated. XRD measurements provided evidence of cubic highly textured CdO(1 0 0) films. The surface atomic composition was investigated by XPS analysis. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%. Resistivity measurements of CdO thin films showed that they are highly conducting. ESR analysis suggests the presence of Cd+ ions, on the site of Cd2+, arising from polaronic self-trapping of electrons introduced by oxygen deficiency at Cd2+ sites to generate localised 5s1 states.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Tabbi', Giovanni
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