Microstructure and current transport in Ti/Al/Ni/Au ohmic contacts to n-type AlGaN epilayers grown on Si(111)

Articolo
Data di Pubblicazione:
2006
Abstract:
The microstructure and the current transport in Ti/Al/Ni/Au ohmic contacts on AlGaN were investigated in this paper.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
AlGaN; ohmic contacts; Ti/Al/Ni/Au; C-AFM
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/408495
Pubblicato in:
SUPERLATTICES AND MICROSTRUCTURES
Journal