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Characterization of a Charge-Coupled-Device detector in the 1100-0.14-nm (1-eV to 9-keV) spectral region

Articolo
Data di Pubblicazione:
1999
Abstract:
The performances of a CCD detector have been evaluated in a wide spectral region, which ranges from the near IR to the soft x ray. Four different experimental setups have been used: a Czerny-Turner monochromator for the 1100-250-nm region, a normal-incidence Johnson-Onaka monochromator for the 250-30-nm region, a grazing-incidence Rowland monochromator for the 30-0.27-nm region, and a test facility with broadband filters for the 0.27-0.14-nm region. The CCD is thinned and backilluminated, with a 512 x 512 format and 24 mu m X 24 mu m pixels. The quantum efficiency was measured in the 1100-0.14-nm (1-eV to 9-keV) region, and the uniformity of response was in the 1100-58-nm (1-21-eV) region. Contamination effects in the vacuum UV range are also discussed.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Poletto, Luca
Autori di Ateneo:
POLETTO LUCA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/125346
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