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Electronic and transport properties of silicon nanowires

Articolo
Data di Pubblicazione:
2007
Abstract:
The electronic, structural and transport properties of silicon nanowires have been investigated with different approaches. The Empirical Tight-Binding model (ETB) and Linear Combination of Bulk Bands (LCBB) method are used to calculate effect of quantum confinement on electronic energies, bandgap and effective masses in silicon nanowires in function of Si cell size. Both hydrogenated and SiO2 terminated silicon surfaces are studied. Transport properties of nanowires are obtained by applying the Non-Equilibrium Green Function (NEGF) method. NEGF approach has been used to describe nanoMOSFET devices based on Silicon nanowires.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Silicon nanowires; NanoMOSFET; Tight-binding; NEGF
Elenco autori:
Pecchia, Alessandro
Autori di Ateneo:
PECCHIA ALESSANDRO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/202191
Pubblicato in:
JOURNAL OF COMPUTATIONAL ELECTRONICS (PRINT)
Journal
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