Comparative analysis of the growth of SmBa2Cu3O7-x thin films by off-axis pulsed laser deposition on different substrates

The growth of SmBa2Cu3O7-x superconducting thin films by off-axis pulsed laser deposition on different substrates (SrTiO3, MgO, LaAlO3, and YSZ) has been analyzed by means of resistance vs. temperature and X-ray diffraction measurements. The onset and width of the resistive transition depend on the substrate type and are in the ranges (89-80) K and (1-9) K, respectively. X-ray diffraction spectra show only the 00l reflections, from which the lattice parameter c can be estimated. Moreover, the rocking curves of the 005 peaks give an indication of the films' crystallinity and oxygen stoichiometry.