ANALYSIS OF HOT-CARRIER-INDUCED DEGRADATION IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
Conference Paper
Publication Date:
1993
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Mariucci, Luigi; Pecora, Alessandro; Fortunato, Guglielmo; Tallarida, Graziella
Book title:
ESSDERC '93 - PROCEEDINGS OF THE 23RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE