Aluminum dimethylisopropoxide decomposition and the growth of dense alumina thin films at low temperature
Articolo
Data di Pubblicazione:
2002
Abstract:
By using aluminum dimethylisopropoxide as the precursor, varying the
reaction conditions (such as temperature and total pressure) and, most
important, by using water vapour as the reacting gas, we obtained high
density, transparent aluminum oxide films with extremely smooth surface
texture, at growth temperatures as low as 180°C, and a growth rate of up
to about 150 nm min1. A reaction mechanism has been proposed for the
precursor decomposition, stressing the important role of water vapour in
the decomposition process.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
alumina; thin films; MOCVD
Elenco autori:
Battiston, Giovanni; Gerbasi, Rosalba
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