Data di Pubblicazione:
2012
Abstract:
This overview highlights very recent application of electron backscatter diffraction (EBSD) to shape memory alloys, as main investigation technique but also as ancillary technique for other characterization methods. Over the last two decades EBSD linked to the scanning electron microscope has become a powerful tool for the characterization of many materials and transformations. In the meantime, shape memory alloys (SMA) are continuously studied: from a theoretical point of view, in order to clarify unsolved fundamentals of their phase transformations and characterize or develop new SMA systems, and from an engineering point of view, to solve design and processing problems related to the continuously growing examples of applications. Application of EBSD to SMA, even if hindered by limitations generally found also in other metallic systems when phase transformation and martensitic phases are involved, provided useful information for both research areas. © (2012) Trans Tech Publications, Switzerland.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
EBSD; Electron backscatter diffraction; NiTi; Shape memory alloys; SMA
Elenco autori:
Bassani, Paola
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