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Surface impedance measurements of Nb/(Cu-Mn) artificial multilayers

Articolo
Data di Pubblicazione:
2000
Abstract:
Surface impedance measurements of Nb/Cu and Nb/(Cu-Mn) multilayers, produced by a co-sputtering technique, have been performed in the microwave region using an inverted microstrip resonator. The aim of the work is to study the electromagnetic response of layered, proximity coupled superconductors, doped with magnetic impurities, and the role of pair breaking and gaplessness. Various samples with constant thickness layering and different Mn doping have been studied. The temperature dependence of surface resistance and penetration depth has been analysed.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
FILMS; BILAYERS; penetration depth; surface impedance; microwaves
Elenco autori:
Russo, Roberto; Salluzzo, Marco
Autori di Ateneo:
RUSSO ROBERTO
SALLUZZO MARCO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/201836
Pubblicato in:
PHYSICA. B, CONDENSED MATTER
Journal
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URL

http://dx.doi.org/10.1016/S0921-4526(99)02270-X
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