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Whole-wafer fabrication process for three-terminal double stacked tunnel junctions

Articolo
Data di Pubblicazione:
2001
Abstract:
A new fabrication process for three-terminal superconducting devices consisting of two Josephson junctions in a stacked configuration is reported. The process is based on the deposition of the whole Nb/Al x O y/Nb-Al/Al x O y/Nb multilayer on a Si crystalline wafer without any vacuum breaking. Lift-off techniques, anodization processes and a SiO film deposition have been adopted for patterning and insulating the two tunnel stacked junctions. Devices have been characterized in terms of current-voltage (IV) curves and Josephson ...
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Josephson effect; Three termnal devices; Stacked junctions
Elenco autori:
Granata, Carmine
Autori di Ateneo:
GRANATA CARMINE
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/334497
Pubblicato in:
THE EUROPEAN PHYSICAL JOURNAL. B, CONDENSED MATTER PHYSICS
Journal
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http://www.scopus.com/inward/record.url?eid=2-s2.0-0000209243&partnerID=q2rCbXpz
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