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Determination of vanadium valence in hydrated compounds

Articolo
Data di Pubblicazione:
2004
Abstract:
X-ray photoelectron spectroscopy was used to determine the chemical shift and full-width at half-maximum intensity of the V4+ and V5+ cations peaks in the vanadium pentoxide matrix. It was found that the binding energy of V4+ ions shifts to the lower energy side of about 1.3 eV as compared with the main V5+ ions in the matrix. The V 2p(3/2) line width for tetravalent vanadium ions in xerogels is actually the same as for pentavalent ions. The fitting procedure of X-ray photoelectron spectra permits determination of the relative concentrations of the reduced vanadium ions with an accuracy of about 3%.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
surfaces and interface; sol-gel synthesis; photoelectron spectroscopy
Elenco autori:
Kaciulis, Saulius
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/159831
Pubblicato in:
JOURNAL OF ALLOYS AND COMPOUNDS
Journal
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