Strain and Ge concentration determinations in SiGe/Si multiple quantum wells by TEM methods

Conference Paper
Publication Date:
1999
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
silicon
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/213002
Book title:
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999
Published in:
INSTITUTE OF PHYSICS CONFERENCE SERIES
Series