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A Microwave Scanner for Sub-surface Diagnostics of Artefacts

Conference Paper
Publication Date:
2015
abstract:
A microwave scanner operating in the frequency band 1 - 10 GHz is described. The system is based on an evanescent-field resonant sensor, allowing to obtain maps of dielectric contrast through a measurement of resonance frequency (F maps) and quality factor (Q maps). Laboratory experiments are presented with results validating the measurement system.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
scanner; microwave microscopy; dielectrometry; diagnostics
List of contributors:
Micheletti, Filippo; Riminesi, Cristiano; Olmi, Roberto; Priori, Saverio
Authors of the University:
MICHELETTI FILIPPO
PRIORI SAVERIO
RIMINESI CRISTIANO
Handle:
https://iris.cnr.it/handle/20.500.14243/302609
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