A Microwave Scanner for Sub-surface Diagnostics of Artefacts

Contributo in Atti di convegno
Data di Pubblicazione:
2015
Abstract:
A microwave scanner operating in the frequency band 1 - 10 GHz is described. The system is based on an evanescent-field resonant sensor, allowing to obtain maps of dielectric contrast through a measurement of resonance frequency (F maps) and quality factor (Q maps). Laboratory experiments are presented with results validating the measurement system.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
scanner; microwave microscopy; dielectrometry; diagnostics
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/302609