High Magnetic Field Dependence of Capture/Emission Fluctuations of a Single Defect in Silicon MOSFETs

Conference Paper
Publication Date:
2005
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Handle:
https://iris.cnr.it/handle/20.500.14243/193299
Book title:
AIP Conference Proceedings