Reflection XAFS

Chapter
Publication Date:
2016
abstract:
This chapter describes the technique of total reflection XAS.
Iris type:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
Reflection XAS; Synchrotron Radiation Instrumentation; XAS data analysis
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/322299
Book title:
XAFS Techniques for Catalysts, Nanomaterials, and Surfaces