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Conductance Quantization in Schottky-gated Si/SiGe Quantum Point Contacts

Conference Paper
Publication Date:
2007
abstract:
We report on the fabrication and electronic transport characterisation of Schottky-gated strongly confined Si/SiGe quantum point contacts (QPC). At zero magnetic field and T=450mK the QPC conductance as a function of gate voltage shows a quantization in units of e(2)/h, indicative of transport through 1D modes which appear to lack both spin and valley degeneracy.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
silicon-germanium; conductance quantization; quantum point contact; 1 DEG; 2DEG
List of contributors:
Notargiacomo, Andrea; Evangelisti, Florestano; Giovine, Ennio; Leoni, Roberto
Authors of the University:
GIOVINE ENNIO
NOTARGIACOMO ANDREA
Handle:
https://iris.cnr.it/handle/20.500.14243/76015
Book title:
Physics of Semiconductors
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