Conductance Quantization in Schottky-gated Si/SiGe Quantum Point Contacts
Contributo in Atti di convegno
Data di Pubblicazione:
2007
Abstract:
We report on the fabrication and electronic transport characterisation of Schottky-gated strongly confined Si/SiGe quantum point contacts (QPC). At zero magnetic field and T=450mK the QPC conductance as a function of gate voltage shows a quantization in units of e(2)/h, indicative of transport through 1D modes which appear to lack both spin and valley degeneracy.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
silicon-germanium; conductance quantization; quantum point contact; 1 DEG; 2DEG
Elenco autori:
Notargiacomo, Andrea; Evangelisti, Florestano; Giovine, Ennio; Leoni, Roberto
Link alla scheda completa:
Titolo del libro:
Physics of Semiconductors