A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen

An analytical model for the electric field associated with a periodic array of alternating p- and n-doped stripes lying in a half-plane, tilted with respect to the specimen edges and thus better representing the actual experimental set-up is presented. With respect to a previous treatment, relative to the case of stripes perpendicular to the edge, a more physical derivation is outlined, and the calculated phase shift is used to interpret the main features of holography and Lorentz microscopy images, allowing a quantitative assessment of the influence of the specimen edge on them.