Data di Pubblicazione:
2013
Abstract:
Combining reflection high-energy electron diffraction, high-resolution transmission electron microscopy, and high-angle annular dark field scanning transmission electron microscopy we unveil the existence of a peculiar transition from a three-dimensional to a two-dimensional growth mode in anatase TiO2/LaAlO3 heterostructures. Such a growth dynamics is accompanied by Al interdiffusion from substrate to the growing film up to a critical thickness of 20 nm. With the extra support of ab initio calculations, we show that the crossover between the two growth modes corresponds to the formation of two distinct regions characterized by (103)- and (101)-oriented crystallographic shear superstructures, occurring in the upmost film region and in proximity of the film/substrate interface, respectively. © 2013 Springer Science+Business Media Dordrecht.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Ab initio calculations; Crystallographic shears; Defects and impurities; Film/substrate interface; Gradient and other corrections; High-angle annular dark fields; Thin-film structure; Two-dimensional growth; Chemical analysis; Density functional theory; Film growth; Interfaces (materials); Lanthanum alloys; Local density approximation; Segregation (metallography); Transmission electron microscopy; Titanium dioxide; aluminum; lanthanum; nanofilm; titanium dioxide; ab initio calculation; article; crystal structure; diffusion; film; molecular dynamics; particle size; phase transition; priority journal; scanning transmission electron microscopy; thickness; transmission electron microscopy; X ray diffraction
Elenco autori:
SCOTTI DI UCCIO, Umberto; Arpaia, Riccardo; Ciancio, Regina; Vittadini, Andrea; MILETTO GRANOZIO, Fabio; Carlino, Elvio; Aruta, Carmela
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