Comment on "Thickness-dependent morphology, microstructure, adsorption and surface free energy of sputtered CeO2 films", by Tan et al. Ceram. Int. 46 (2020) 13925-13931
Academic Article
Publication Date:
2021
abstract:
Analysis of factors that regulate the peak fittings of XPS Ce3d spectra of cerium oxides
Iris type:
01.01 Articolo in rivista
Keywords:
XPS Cerium oxides
List of contributors:
Paparazzo, Ernesto
Published in: