Comment on "Thickness-dependent morphology, microstructure, adsorption and surface free energy of sputtered CeO2 films", by Tan et al. Ceram. Int. 46 (2020) 13925-13931

Articolo
Data di Pubblicazione:
2021
Abstract:
Analysis of factors that regulate the peak fittings of XPS Ce3d spectra of cerium oxides
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
XPS Cerium oxides
Elenco autori:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/458867
Pubblicato in:
CERAMICS INTERNATIONAL
Journal