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Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure
Patent
Publication Date:
2003
Iris type:
06.01 Brevetto di invenzione industriale
List of contributors:
Iodice, Mario; Ferraro, Pietro
Authors of the University:
FERRARO PIETRO
IODICE MARIO
Handle:
https://iris.cnr.it/handle/20.500.14243/220630
