Linear Sampling Method: Physical Interpretation and Guidelines for a Successful Application

The Linear Sampling Method (LSM) is an e®ective method to tackle the prob- lem of reconstructing the shape of unknown metallic or dielectric scatterers from the knowledge of single frequency multi-view/multi-static data. Notably, as it just requires to solve a linear problem, its implementation is straightforward and its computational burden almost negligible. However, no results are available in the literature to explain under which operating conditions (e.g., the number of incident waves and receivers which has to be considered) LSM properly works. With respect to the case of dielectric scatterers, in this communication, starting from the physical interpretation of LSM, we provide some guidelines for its successful application. These results are then con¯rmed processing experimental data from the \Marseille" data-set.