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Metrological Detection of Multipartite Entanglement from Young Diagrams

Articolo
Data di Pubblicazione:
2021
Abstract:
We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson's rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and k-separability are contained in this approach as the diagram's width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
metrology; quantum entanglement
Elenco autori:
Smerzi, Augusto
Autori di Ateneo:
SMERZI AUGUSTO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/458647
Pubblicato in:
PHYSICAL REVIEW LETTERS
Journal
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URL

https://journals.aps.org/prl/abstract/10.1103/PhysRevLett.126.080502
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