Radial Basis Functions for Electronic Devices Behavioral Modeling

In this paper a black-box identification technique based on the radial basis functions is used in developing global dynamic behavioural models of electronic devices from measured transient responses. This approach allows to reproduce a non-linear dynamic model of the device under modelling automatically taking into account all the physical effects relating input and output data, from measured waveform only: no knowledge of the internal structure is needed. Original application related to a bipolar junction transistor is reported and validated by comparing simulation results with measured data.