Non invasive Analysis of Thin Turbid Layers Using Microscale Spatially Offset Raman Spectroscopy

Here, we demonstrate, for the first time, the extension of applicability of recently developed microscale spatially offset Raman spectroscopy (SORS), micro-SORS, from the area of cultural heritage to a wider range of analytical problems involving thin, tens of micrometers thick diffusely scattering turbid layers. The method can be applied in situations where a high turbidity of layers prevents the deployment of conventional confocal Raman microscopy with its depth resolving capability. The method was applied successfully to detect noninvasively the presence of thin, highly turbid layers within polymers, wheat seeds, and paper. An invasive, cross sectional analysis confirmed the micro-SORS findings. Micro-SORS represents a new Raman imaging modality expanding the portfolio of noninvasive, chemically specific analytical tools.