Data di Pubblicazione:
2005
Abstract:
Cadmium bis(O-alkylxanthates) are po tential single-source molecular precursors for the chemical vapor deposition (CVD) of Cd(II) sulfide thin films. In this work, a multi-technique characterization of Cd(O-RXan)2 compounds [where O-RXan is CH3CH2OCS2 (O-EtXan) or (CH3)2CHOCS2 (O-iPrXan)] is performed by means of several analytical methods (extended x-ray absorption fine structure, Raman, Fourier transform infrared and optical absorption, spectroscopics 1H and 13C NMR, thermal analysis and mass spectrometry) for a thorough investigation of their structure and chemical-physical properties. The most important results concerning the chemical behavior under different experimental conditions, with particular attention to relevant properties for CVD applications, are presented and discussed
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
cadmium(II)bis(O-alkylxanthates); CdS; EXAFS; NMR; mass-spectrometry
Elenco autori:
Seraglia, Roberta; Barreca, Davide; Venzo, Alfonso
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