Data di Pubblicazione:
2006
Abstract:
In this study we modified and optimized a technique using an ordinary spin-coater device to deposit lipids on chemically etched silicon substrates. Tapping-mode atomic force microscopy is used for sample characterization, thereby realizing non destructive characterization with nanometrical resolution. © 2006 The Japan Society of Applied Physics.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Atomic Force Microscopy; Lipid multilayers; Nanometrical resolution; Silicon substrates; Spin-coating
Elenco autori:
Cricenti, Antonio
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