Scanning Probe Microscopy Applied to Ferroelectric Materials

Chapter
Publication Date:
2006
abstract:
Scanning Probe Microscopy Applied to Ferroelectric Materials
Iris type:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
ferroelectrics; scanning probe microscopy
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/86977
Book title:
Applied Scanning Probe Methods III