SURFACE IMPEDANCE MEASUREMENTS OF SUPERCONDUCTING V3SI FILMS BY A MICROSTRIP RESONATOR TECHNIQUE

Using a ring microstrip resonator technique, the surface impedance of V3Si sputtered films has been measured as a function of temperature and de and rf field amplitude. The results are analyzed in terms of the Bardeen-Cooper-Schrieffer theory and of a grain-boundary Josephson model, and discussed in the framework of the possible application of V3Si as a thin-film coating of superconducting rf cavities for particle accelerators. (C) 1995 American Institute of Physics.