Data di Pubblicazione:
2007
Abstract:
We have developed a setup for measuring holographically formed interference patterns using an integrated sample-mask design. The direct space image of the sample is obtained via a two-dimensional Fourier transform of the x-ray diffraction pattern. We present the details of our setup, commenting on the influence of geometrical parameters on the imaging capabilities. As an example, we present and discuss the results of test experiments on a patterned Co film. (c) 2007 American Institute of Physics.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
HOLOGRAPHY
Elenco autori:
Prasciolu, Mauro; Carpentiero, Alessandro
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