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Effect of He Dilution on the Growth Kinetics of SiH4-H2 Plasmas: Structural Studies on mc-Si by Micro-Raman, X-ray diffraction and Spectroscopic Ellipsometry

Conference Paper
Publication Date:
2005
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Capezzuto, Pio; Losurdo, Maria; Bruno, Giovanni
Handle:
https://iris.cnr.it/handle/20.500.14243/53822
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