Data di Pubblicazione:
2000
Abstract:
SnO2 nanocrystalline thin films are deposited on Al2O3 and SiO2/Si(100) by chemical vapor
deposition starting from diethylaminodimethylstannane (IV) [(CH3)2Sn(N(C2H5)2)2]. X-ray
photoelectron spectra of the principal core levels for the surface of a SnO2 film on SiO2/Si(100) are
presented.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Zanella, Pierino; Barreca, Davide
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