Publication Date:
2007
abstract:
Quantitative analysis of nanometric films is achieved by soft X-ray imaging using a laser-plasma source and LiF crystals as detectors. Excitation of color center fluorescence in exposed LiF allows image detection with sub-micron resolution
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Villoresi, Paolo; Nisoli, Mauro; Stagira, Salvatore; Sansone, Giuseppe; Valentini, Gianluca; DE SILVESTRI, Sandro; Vozzi, Caterina; Calegari, Francesca; Poletto, Luca
Book title:
2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007)