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Electron Spectroscopy Study of Plasma Assisted Amorphous Carbon Deposition

Articolo
Data di Pubblicazione:
2000
Abstract:
We report the results of a study of the electronic structure of carbon-based thin films deposited by a RF plasma. A novel cylindrical plasma configuration has been used to grow amorphous hydrogenated carbon films. Electrons within a low pressure, two-temperature plasma are constrained to oscillate between two electrodes and ionize methanerhydrogen mixtures. The ions that form are near room temperature. They drift out of the trap region to deposit on a substrate located beyond the electrodes. The underlying strength of this configuration rests in the ability to control several plasma parameters independently: the flux, energy, and the ratio of the charged to neutral particles leaving the plasma, and the chemical species being deposited. Adjusting these parameters alters the density of the film being grown, its hydrogen content, and the film's porosity and morphology. Films of thickness up to 10 mm have been grown on flat substrates and on cylindrical plastic micro spheres. The electronic structure properties of this material has been studied via X-ray photoemission spectroscopy XPS. and electron energy loss spectroscopy. The thus-obtained films show primarily a-C:H character. Q 2000 Elsevier Science S.A. All rights reserved.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
XPAS; EELS; RF-Plasma; DLC
Elenco autori:
Ghezzi, FRANCESCO MAURO
Autori di Ateneo:
GHEZZI FRANCESCO MAURO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/122631
Pubblicato in:
THIN SOLID FILMS
Journal
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