Lattice strain and static disorder determination in Si/Si_ {1-x} Ge_ {x}/Si heterostructures by convergent beam electron diffraction

Academic Article

Publication Date:

1999

Iris type:

01.01 Articolo in rivista

Keywords:

BOND-LENGTH RELAXATION; SI1-XGEX ALLOYS; MICROSCOPY; SIMULATION; PARAMETERS; MISMATCH

List of contributors:

Authors of the University:

BALBONI ROBERTO

Handle:

Published in:

Journal