Data di Pubblicazione:
2002
Abstract:
A high-intensity two-crystal four-220-reflection germanium monochromator is
proposed for high-resolution X-ray diffraction. The beam divergence in the
diffraction plane and the fractional wavelength band-pass are smaller by
40% than those of the well known Bartels monochromator, while the flux
collected from the source is larger by a factor of five.
Tipologia CRIS:
01.01 Articolo in rivista
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