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X-ray monochromator combining high resolution with high intensity

Articolo
Data di Pubblicazione:
2002
Abstract:
A high-intensity two-crystal four-220-reflection germanium monochromator is proposed for high-resolution X-ray diffraction. The beam divergence in the diffraction plane and the fractional wavelength band-pass are smaller by 40% than those of the well known Bartels monochromator, while the flux collected from the source is larger by a factor of five.
Tipologia CRIS:
01.01 Articolo in rivista
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/53201
Pubblicato in:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Journal
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