Erratum to "Raman spectroscopy of Si1-xGex epilayers"

Articolo
Data di Pubblicazione:
2007
Abstract:
The authors regret misprint error in Eq. (3) of the following published article: Raman spectroscopy of Si1-xGex epilayers Materials Science and Engineering: B, Volumes 124-125, 5 December 2005, Pages 127-131.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Raman spectroscopy; SiGe
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/409336
Pubblicato in:
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
Journal